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Data Converter Fundamentals
Prof. Abhishek Kadam
Analog Versus Discrete Time Signals
β€’ The original analog signal is filtered by an anti-aliasing filter to remove any
high-frequency components that may cause an effect known as aliasing
β€’ The signal is sampled and held and then converted into a digital signal
Analog Versus Discrete Time Signals
β€’ Next the DAC converts the digital signal back into an analog signal
β€’ Output of the DAC is not as "smooth" as the original signal. A low-
pass filter returns the analog signal back to its original form
β€’ the Nyquist Criterion
π‘“π‘ π‘Žπ‘šπ‘π‘™π‘–π‘›π‘” = 2 βˆ— 𝑓 𝑀𝐴𝑋
Sample-and-Hold (S/H)
Characteristics
β€’ Sample-and-hold (S/H) circuits are critical in
converting analog signals to digital signals
β€’ It is important to characterize the S/H circuit
when performing data conversion.
β€’ Ideally, the S/H circuit should have an output
similar to that shown
a track-and-hold circuit
Typical errors associated with an S/H.
β€’ Sample Mode
– Once the sampling command has been issued, the time required for
the S/H to track the analog signal to within a specified tolerance is
known as the acquisition time
– if the input changes very quickly, then the output of the T/H could be
limited by the amplifier's slew rate
– If the amplifier is not compensated correctly, and the phase margin is
too small, then a large overshoot will occur.
– Error tolerance at the output of the S/H also depends on the
amplifier's offset, gain error
Typical errors associated with an S/H.
β€’ Hold Mode
– Pedestal error occurs as a result of charge injection and clock feed through
– Another error that occurs during the hold mode is called droop
β€’ This error is related to the leakage of current from the capacitor due to parasitic impedances
and to the leakage through the reverse-biased diode formed by the drain of the switch.
β€’ This diode leakage can be minimized by making the drain area as small as can be tolerated
β€’ The switch has a finite OFF impedance through which leakage can occur
β€’ Current can also leak through the substrate
β€’ The key to minimizing droop is increasing the value of the sampling capacitor.
β€’ The trade-off, however, is increased time that's required to charge the capacitor to the value of
the input signal.
β€’ Aperture Error
– A transient effect that introduces error occurs between the
sample and the hold modes.
– A finite amount of time, referred to as aperture time, is required
to disconnect the capacitor from the analog input source.
– The aperture time actually varies slightly as a result of noise on
the hold-control signal and the value of the input signal,
– This effect is called aperture uncertainty or aperture jitter.
– As a result, if a periodic signal were being sampled repeatedly at
the same points, slight variations in the hold value would result,
thus creating sampling error
– Note that the amount of aperture error is directly related to the
– frequency of the signal that the worst-case aperture error occurs
at the zero crossing, where dV/dt is the greatest.
Digital-to-Analog Converter (DAC)
Specifications
π‘‰π‘œπ‘’π‘‘ = πΉπ‘‰π‘Ÿπ‘’π‘“
Where π‘‰π‘œπ‘’π‘‘ is analog voltage output
𝑉𝑅𝐸𝐹 is the reference voltage,
F =
𝐷
2 𝑁 is the fraction defined by the input word, D, that is N bits wide.
The number of input combinations represented by the input word D is related
to the number of bits in the word by 2 𝑁
1. Resolution
β€’ full-scale voltage, 𝑉𝐹𝑆
β€’ When discussing data
converters, the term
resolution describes the
smallest change in the
analog output with
respect to the value of
the reference voltage,
𝑉𝑅𝐸𝐹
Q::Find the resolution for a DAC if the output voltage is desired to change in 1 mV
increments while using a reference voltage of 5 V.
Q::Find the number of input combinations, values for 1 LSB, the percentage
accuracy, and the full-scale voltage generated for a 3-bit, 8-bit, and 16-bit DAC,
assuming that 𝑉𝑅𝐸𝐹 = 5 V.
β€’ Differential Nonlinearity
– Non ideal components cause the analog
increments to differ from their ideal values. The
difference between the ideal and non ideal values
is known as differential nonlinearity, or DNL
DNLn = Actual increment height of transition n –
Ideal increment height
β€’ Determine the DNL for the 3-bit nonideal DAC
whose transfer curve is shown Assume π‘‰π‘Ÿπ‘’π‘“ =
5V
β€’ If the DNL for a DAC is less than -1 LSBs, then
the DAC is said to be nonmonotonic,
β€’ Which means that the analog output voltage
does not always increase as the digital input
code is incremented.
β€’ A DAC should always exhibit monotonicity if it
is to function without error
β€’ Integral Nonlinearity
– Another important static characteristic of DACs is
called integral nonlinearity (INL).
– Defined as the difference between the data
converter output values and a reference straight line
drawn through the first and last output values
– INL defines the linearity of the overall transfer curve
and can be described as
– It is common practice to assume that a converter
with JV-bit resolution will have less than Β±0.5 𝐿𝑆𝐡
of DNL and INL
Determine the INL for the non ideal 3-bit DAC shown in below. Assume that
π‘‰π‘Ÿπ‘’π‘“ = 5V
β€’ Offset
– The analog output should be 0 V for D = 0. However,
an offset exists if the analog output voltage is not
equal to zero.
β€’ Gain Error
– A gain error exists if the slope of the best-fit line
through the transfer curve is different from the slope
of the best-fit line for the ideal case.
β€’ Latency
– This specification defines the total time from the
moment that the input digital word changes to the
time the analog output value has settled to within a
specified tolerance.
– Latency should not be confused with settling time
β€’ Signal-to-Noise Ratio (SNR)
– Signal-to-noise (SNR) is defined as the ratio of the
signal power to the noise at the analog output.
β€’ Dynamic Range
– Dynamic range is defined as the ratio of the largest
output signal over the smallest output signal.
Analog-to-Digital Converter (ADC)
Specifications
β€’ Quantization error
β€’ Since the analog input is an infinite valued
quantity and the output is a discrete value, an
error will be produced as a result of the
quantization.
β€’ This error, known as quantization error, Qe, is
defined as the difference between the actual
analog input and the value of the output
(staircase) given in voltage.
β€’ It is calculated as 𝑄 𝑒 = 𝑉𝑖𝑛 βˆ’ π‘‰π‘ π‘‘π‘Žπ‘–π‘Ÿπ‘π‘Žπ‘ π‘’
β€’ Where π‘‰π‘ π‘‘π‘Žπ‘–π‘Ÿπ‘π‘Žπ‘ π‘’ = 𝐷 βˆ— 𝑉𝐿𝑆𝐡
β€’ Differential Nonlinearity
– Differential nonlinearity for an ADC is similar to that
defined for a DAC. However, for the ADC, DNL is the
difference between the actual code width of a
nonideal converter and the ideal case
– DNL = Actual step width - Ideal step width
– Calculate DNL
β€’ Missing Codes
β€’ Integral Nonlinearity
– INL being defined as the difference between the
data converter code transition points and the
straight line with all other errors set to zero.
β€’ Offset and Gain Error
β€’ Offset error occurs when there is a difference
between the value of the first code transition
and the ideal value of
1
2
LSBs
β€’ Gain error or scale factor error is the difference
in the slope of a straight line drawn through the
transfer characteristic and the slope of 1 of an
ideal ADC
β€’ Aliasing
Aliasing can be eliminated by both sampling at higher frequencies and by filtering
the analog signal before sampling and removing any frequencies that are greater than
one-half the sampling frequency.
β€’ Signal-to-Noise Ratio
– Signal-to-noise (SNR) ratios of ADCs represent the
value of the largest RMS input signal into the
converter over the RMS value of the noise. Typically
given in dB, the expression for SNR is
𝑺𝑡𝑹 =6.02N + 1.76
β€’ Aperture Error
β€’ Example 28.8
β€’ Find the maximum resolution of an ADC which
can use the S/H described in Ex. 1 while
maintaining a sampling error less than 1/2 LSB.
β€’ A DAC has a full-scale voltage of 4.97 V using a 5
V reference, and its minimum output voltage is
limited by the value of one LSB. Determine the
resolution and dynamic range of the converter
Mixed-Signal Layout Issues
β€’ Floor-planning
β€’ Power Supply and Grounding Issues
β€’ By using separate pads and pins, the analog and the
digital circuits are completely decoupled
β€’ It is not wise to use two separate power supplies
because if both types of circuits are not powered up
simultaneously, latch-up could easily result
β€’ the resistance associated with the analog
connection to ground or supply can be reduced by
making the power supply and ground bus as wide
as feasible.
β€’ One could reduce the effect of the wire inductance
by reserving pins closest to the die for sensitive
connections such as analog supply and ground.
β€’ Fully Differential Design
In a mixed-signal environment,
layout techniques should be used to improve matching such as common-centroid and
interdigitated techniques.
β€’ Guard Rings
– Guard rings should be used wisely throughout a
mixed-signal environment.
– Circuits that process sensitive signals should be
placed in a separate well (if possible) with guard
rings attached to the analog VDD supply. In the case
of an n-well (only) process, the n-type devices
outside the well should have guard rings attached to
analog ground placed around them.
– Digital circuits should be placed in their own well
with guard rings attached to digital VDD. Guard rings
placed around the n-channel digital devices also help
minimize the amount of noise transmitted from the
digital devices
β€’ Shielding
– A number of techniques exist which can shield
sensitive, low-level analog signals from noise
resulting from digital switching
– If at all possible, one should avoid crossing sensitive
analog signals, such as low-level analog input signals,
with any digital signals
– Another situation that should be avoided is running
an interconnect containing sensitive analog signals
parallel and adjacent to any interconnect carrying
digital signals.
– Coupling occurs due to the parasitic capacitance
between the lines. If this situation cannot be
avoided, then an additional line connected to analog
ground should be placed between the two signals,
β€’ Other Interconnect Considerations
– When routing the analog circuitry, minimize the
lengths of current carrying paths.
– Vias and contacts should also be used very liberally
whenever changing layers.
– Avoid using poly to route current carrying signal
paths
– Use poly to route only high-impedance gate nodes
that carry virtually no current.

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Data converter fundamentals

  • 2. Analog Versus Discrete Time Signals β€’ The original analog signal is filtered by an anti-aliasing filter to remove any high-frequency components that may cause an effect known as aliasing β€’ The signal is sampled and held and then converted into a digital signal
  • 3. Analog Versus Discrete Time Signals β€’ Next the DAC converts the digital signal back into an analog signal β€’ Output of the DAC is not as "smooth" as the original signal. A low- pass filter returns the analog signal back to its original form
  • 4. β€’ the Nyquist Criterion π‘“π‘ π‘Žπ‘šπ‘π‘™π‘–π‘›π‘” = 2 βˆ— 𝑓 𝑀𝐴𝑋
  • 5. Sample-and-Hold (S/H) Characteristics β€’ Sample-and-hold (S/H) circuits are critical in converting analog signals to digital signals β€’ It is important to characterize the S/H circuit when performing data conversion. β€’ Ideally, the S/H circuit should have an output similar to that shown
  • 7. Typical errors associated with an S/H. β€’ Sample Mode – Once the sampling command has been issued, the time required for the S/H to track the analog signal to within a specified tolerance is known as the acquisition time – if the input changes very quickly, then the output of the T/H could be limited by the amplifier's slew rate – If the amplifier is not compensated correctly, and the phase margin is too small, then a large overshoot will occur. – Error tolerance at the output of the S/H also depends on the amplifier's offset, gain error
  • 8.
  • 9. Typical errors associated with an S/H. β€’ Hold Mode – Pedestal error occurs as a result of charge injection and clock feed through – Another error that occurs during the hold mode is called droop β€’ This error is related to the leakage of current from the capacitor due to parasitic impedances and to the leakage through the reverse-biased diode formed by the drain of the switch. β€’ This diode leakage can be minimized by making the drain area as small as can be tolerated β€’ The switch has a finite OFF impedance through which leakage can occur β€’ Current can also leak through the substrate β€’ The key to minimizing droop is increasing the value of the sampling capacitor. β€’ The trade-off, however, is increased time that's required to charge the capacitor to the value of the input signal.
  • 10. β€’ Aperture Error – A transient effect that introduces error occurs between the sample and the hold modes. – A finite amount of time, referred to as aperture time, is required to disconnect the capacitor from the analog input source. – The aperture time actually varies slightly as a result of noise on the hold-control signal and the value of the input signal, – This effect is called aperture uncertainty or aperture jitter. – As a result, if a periodic signal were being sampled repeatedly at the same points, slight variations in the hold value would result, thus creating sampling error – Note that the amount of aperture error is directly related to the – frequency of the signal that the worst-case aperture error occurs at the zero crossing, where dV/dt is the greatest.
  • 11.
  • 12. Digital-to-Analog Converter (DAC) Specifications π‘‰π‘œπ‘’π‘‘ = πΉπ‘‰π‘Ÿπ‘’π‘“ Where π‘‰π‘œπ‘’π‘‘ is analog voltage output 𝑉𝑅𝐸𝐹 is the reference voltage, F = 𝐷 2 𝑁 is the fraction defined by the input word, D, that is N bits wide. The number of input combinations represented by the input word D is related to the number of bits in the word by 2 𝑁 1. Resolution
  • 13. β€’ full-scale voltage, 𝑉𝐹𝑆 β€’ When discussing data converters, the term resolution describes the smallest change in the analog output with respect to the value of the reference voltage, 𝑉𝑅𝐸𝐹 Q::Find the resolution for a DAC if the output voltage is desired to change in 1 mV increments while using a reference voltage of 5 V. Q::Find the number of input combinations, values for 1 LSB, the percentage accuracy, and the full-scale voltage generated for a 3-bit, 8-bit, and 16-bit DAC, assuming that 𝑉𝑅𝐸𝐹 = 5 V.
  • 14. β€’ Differential Nonlinearity – Non ideal components cause the analog increments to differ from their ideal values. The difference between the ideal and non ideal values is known as differential nonlinearity, or DNL DNLn = Actual increment height of transition n – Ideal increment height
  • 15. β€’ Determine the DNL for the 3-bit nonideal DAC whose transfer curve is shown Assume π‘‰π‘Ÿπ‘’π‘“ = 5V
  • 16. β€’ If the DNL for a DAC is less than -1 LSBs, then the DAC is said to be nonmonotonic, β€’ Which means that the analog output voltage does not always increase as the digital input code is incremented. β€’ A DAC should always exhibit monotonicity if it is to function without error
  • 17. β€’ Integral Nonlinearity – Another important static characteristic of DACs is called integral nonlinearity (INL). – Defined as the difference between the data converter output values and a reference straight line drawn through the first and last output values – INL defines the linearity of the overall transfer curve and can be described as – It is common practice to assume that a converter with JV-bit resolution will have less than Β±0.5 𝐿𝑆𝐡 of DNL and INL
  • 18. Determine the INL for the non ideal 3-bit DAC shown in below. Assume that π‘‰π‘Ÿπ‘’π‘“ = 5V
  • 19. β€’ Offset – The analog output should be 0 V for D = 0. However, an offset exists if the analog output voltage is not equal to zero.
  • 20. β€’ Gain Error – A gain error exists if the slope of the best-fit line through the transfer curve is different from the slope of the best-fit line for the ideal case.
  • 21. β€’ Latency – This specification defines the total time from the moment that the input digital word changes to the time the analog output value has settled to within a specified tolerance. – Latency should not be confused with settling time
  • 22. β€’ Signal-to-Noise Ratio (SNR) – Signal-to-noise (SNR) is defined as the ratio of the signal power to the noise at the analog output. β€’ Dynamic Range – Dynamic range is defined as the ratio of the largest output signal over the smallest output signal.
  • 24. β€’ Since the analog input is an infinite valued quantity and the output is a discrete value, an error will be produced as a result of the quantization. β€’ This error, known as quantization error, Qe, is defined as the difference between the actual analog input and the value of the output (staircase) given in voltage. β€’ It is calculated as 𝑄 𝑒 = 𝑉𝑖𝑛 βˆ’ π‘‰π‘ π‘‘π‘Žπ‘–π‘Ÿπ‘π‘Žπ‘ π‘’ β€’ Where π‘‰π‘ π‘‘π‘Žπ‘–π‘Ÿπ‘π‘Žπ‘ π‘’ = 𝐷 βˆ— 𝑉𝐿𝑆𝐡
  • 25.
  • 26. β€’ Differential Nonlinearity – Differential nonlinearity for an ADC is similar to that defined for a DAC. However, for the ADC, DNL is the difference between the actual code width of a nonideal converter and the ideal case – DNL = Actual step width - Ideal step width – Calculate DNL
  • 27.
  • 29. β€’ Integral Nonlinearity – INL being defined as the difference between the data converter code transition points and the straight line with all other errors set to zero.
  • 30. β€’ Offset and Gain Error β€’ Offset error occurs when there is a difference between the value of the first code transition and the ideal value of 1 2 LSBs β€’ Gain error or scale factor error is the difference in the slope of a straight line drawn through the transfer characteristic and the slope of 1 of an ideal ADC
  • 31.
  • 32. β€’ Aliasing Aliasing can be eliminated by both sampling at higher frequencies and by filtering the analog signal before sampling and removing any frequencies that are greater than one-half the sampling frequency.
  • 33. β€’ Signal-to-Noise Ratio – Signal-to-noise (SNR) ratios of ADCs represent the value of the largest RMS input signal into the converter over the RMS value of the noise. Typically given in dB, the expression for SNR is 𝑺𝑡𝑹 =6.02N + 1.76
  • 35. β€’ Example 28.8 β€’ Find the maximum resolution of an ADC which can use the S/H described in Ex. 1 while maintaining a sampling error less than 1/2 LSB.
  • 36. β€’ A DAC has a full-scale voltage of 4.97 V using a 5 V reference, and its minimum output voltage is limited by the value of one LSB. Determine the resolution and dynamic range of the converter
  • 39. β€’ Power Supply and Grounding Issues
  • 40.
  • 41. β€’ By using separate pads and pins, the analog and the digital circuits are completely decoupled β€’ It is not wise to use two separate power supplies because if both types of circuits are not powered up simultaneously, latch-up could easily result β€’ the resistance associated with the analog connection to ground or supply can be reduced by making the power supply and ground bus as wide as feasible. β€’ One could reduce the effect of the wire inductance by reserving pins closest to the die for sensitive connections such as analog supply and ground.
  • 42. β€’ Fully Differential Design In a mixed-signal environment, layout techniques should be used to improve matching such as common-centroid and interdigitated techniques.
  • 43. β€’ Guard Rings – Guard rings should be used wisely throughout a mixed-signal environment. – Circuits that process sensitive signals should be placed in a separate well (if possible) with guard rings attached to the analog VDD supply. In the case of an n-well (only) process, the n-type devices outside the well should have guard rings attached to analog ground placed around them. – Digital circuits should be placed in their own well with guard rings attached to digital VDD. Guard rings placed around the n-channel digital devices also help minimize the amount of noise transmitted from the digital devices
  • 44. β€’ Shielding – A number of techniques exist which can shield sensitive, low-level analog signals from noise resulting from digital switching – If at all possible, one should avoid crossing sensitive analog signals, such as low-level analog input signals, with any digital signals – Another situation that should be avoided is running an interconnect containing sensitive analog signals parallel and adjacent to any interconnect carrying digital signals.
  • 45.
  • 46. – Coupling occurs due to the parasitic capacitance between the lines. If this situation cannot be avoided, then an additional line connected to analog ground should be placed between the two signals,
  • 47. β€’ Other Interconnect Considerations – When routing the analog circuitry, minimize the lengths of current carrying paths. – Vias and contacts should also be used very liberally whenever changing layers. – Avoid using poly to route current carrying signal paths – Use poly to route only high-impedance gate nodes that carry virtually no current.